Method and Good Estimators for Projection Uniformity Measurement

Metadata

Publisher: SMPTE — White Plains, NY
Doc Type: Conference Paper
Content Type: Original Research
Volume: 2010, No. 10, pp. 1–10
Abstract: An improved method for screen luminance uniformity measurement was proposed in a previous paper using a calibrated digital camera to capture a complete view of the screen in one shot. As large screen projection exhibits vignetting, a model of the vignetting phenomenon is used in this paper to characterize the distribution of luminance values over the screen. The specific geometry of the projection is taken into account in the model by integrating the throw ratio as a parameter of the model. The results give more detailed information and can be used to store and track the history of measures of multiple screens. A similar approach has been explained for flat panel uniformity measurements for the broadcast industry. Once the vignetting of the given projection is compensated for, the process of computing a quality estimator is equivalent for both display systems. Traditional point-wise measurements can be computed from both methods, but it is also worth trying to give more informative measurements and associated tolerances to obtain a useful measurement system. This was left open at the end of the last paper; we will explain how quality measures can be computed and justified. The above mentioned broadcast paper proposes a quality estimator called the “uniformity score”. It is computed from the statistics of small patches evenly distributed all over the screen. It is based on standard deviation and scaled; questions arise about the scaling. Deviations from a perfectly uniform projection may have multiple causes. Any uniformity measure must somehow be related to human perception of uniformity. Random deviations are less visible than structured luminance patterns. It is then logical to complement the standard deviation measure by a statistical measure which may indicate a biased error distribution. One such measure is proposed.
Publication Date: 2010-10-01
DOI: 10.5594/M001398
Link: https://doi.org/10.5594/M001398
Author(s): François HeltDoremi Technologies, France
Copyright: © 2010 Society of Motion Picture and Television Engineers, Inc.

Bibliographic Reference(s)

1- Helt F. , “Proposal for practical screen luminance uniformity measurement” , presented at the 136th SMPTE Technical Conference, Los Angeles, Oct. 2009 . EXTERNAL
2- Poulin F. Caron M. , “Display measurement - a simple approach to small-area luminance uniformity testing” , in EBU Technical Review , Q2 2009 . EXTERNAL
3- Ray Sidney F. , “Photometry of image formation,” in Applied Photographic Optics , 3rd edition , Focal Press 2002 . EXTERNAL
4- Hunt R. W. G. , Measuring Colour , 3rd edition , Fountain Press , England , 1998 . EXTERNAL

Source Data (JSON)

Full registry record with provenance metadata. Open directly: /api/doc/10.5594-M001398.json

Reference Tree

Explore all references and references to this document, as a navigable tree.

Open Reference Tree

Reference this Doc

Plain text (ISO 690 compliant)

Preview:

François Helt; Method and Good Estimators for Projection Uniformity Measurement, SMPTE Meetings and Conferences ( October 2010); SMPTE, 2010. Available at https://doi.org/10.5594/M001398

Snippet:

François Helt; Method and Good Estimators for Projection Uniformity Measurement, SMPTE Meetings and Conferences ( October 2010); SMPTE, 2010. Available at https://doi.org/10.5594/M001398

HTML (ISO 690 compliant)

Preview:

François Helt; Method and Good Estimators for Projection Uniformity Measurement, SMPTE Meetings and Conferences ( October 2010); SMPTE, 2010. Available at https://doi.org/10.5594/M001398

Snippet:

<span class="citation">François Helt; <cite>Method and Good Estimators for Projection Uniformity Measurement</cite>, SMPTE Meetings and Conferences ( October 2010); SMPTE, 2010. Available at <a href="https://doi.org/10.5594/M001398" target="_blank" rel="noopener">https://doi.org/10.5594/M001398</a></span>

SMPTE's HTML Pub

Preview:

François Helt; Method and Good Estimators for Projection Uniformity Measurement, SMPTE Meetings and Conferences ( October 2010); SMPTE, 2010
doi: 10.5594/M001398
url: https://doi.org/10.5594/M001398

Snippet:

<li>
François Helt; <cite id="bib-10-5594-m001398">Method and Good Estimators for Projection Uniformity Measurement</cite>, SMPTE Meetings and Conferences ( October 2010); SMPTE, 2010
<span class="doi">10.5594/M001398</span>
</li>