Gamut Excursion Measurements (GEM)—Improving CIE Usage

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Publisher: SMPTE
Doc Type: Journal Article
Content Type: Original Research
Abbreviated Title: SMPTE Motion Imaging Jour.
Volume: 133, No. 5, pp. 16–23
Abstract: A common task in color grading is to grade to one gamut while constraining to another. For example, the grade to International Telecommunication Union-Radiocommunication (ITU-R) Recommendation BT.2020 is constrained to DCI-P3. If colorists can quantitatively determine the excursions of colors from the gamut of interest, they can either remap the colors or allow them to clip at the gamut boundary. Currently, this work is handled using a combination of legacy tools and monitoring with reference monitors. This can be time-consuming and prone to errors. The CIE chromaticity chart provides a 2D view of the chromaticity content of the image. This paper presents innovations based on deriving valuable data from the CIE chart that helps colorists quickly determine how far off colors are from the gamut of interest. The Gamut Excursion Measurement (GEM) effectively unrolls the CIE chart and presents a quantitative snapshot of the gamut excursions as a 2D linear chart over the spectrum of colors. The excursions can then be visualized (using GEM) with a multi-level false color heat map. Luminance Qualified CIE is a method of constraining the CIE chart against luminance, allowing users to study colors within specific luminance ranges of interest. Combinations of the above tools provide fast, effective techniques for color grading.
Publication Date: 2024-09-01
DOI: 10.5594/JMI.2024/NYYP7085
ISSN: Print: 1545-0279 | Electronic: 2160-2492
Link: https://doi.org/10.5594/JMI.2024/NYYP7085
Author(s): Lakshmanan Gopishankar
Keyword(s): CIE, Color Grading, False Color, Gamut Boundary, Region of Interest, Luminance Qualified
Copyright: © 2024 SMPTE

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Lakshmanan Gopishankar; Gamut Excursion Measurements (GEM)—Improving CIE Usage, MIJ 2024, Volume 133, Number 5 (pp. 16 to 23); SMPTE, 2024. Available at https://doi.org/10.5594/JMI.2024/NYYP7085

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Lakshmanan Gopishankar; Gamut Excursion Measurements (GEM)—Improving CIE Usage, MIJ 2024, Volume 133, Number 5 (pp. 16 to 23); SMPTE, 2024. Available at https://doi.org/10.5594/JMI.2024/NYYP7085

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Lakshmanan Gopishankar; Gamut Excursion Measurements (GEM)—Improving CIE Usage, MIJ 2024, Volume 133, Number 5 (pp. 16 to 23); SMPTE, 2024. Available at https://doi.org/10.5594/JMI.2024/NYYP7085

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<span class="citation">Lakshmanan Gopishankar; <cite>Gamut Excursion Measurements (GEM)—Improving CIE Usage</cite>, MIJ 2024, Volume 133, Number 5 (pp. 16 to 23); SMPTE, 2024. Available at <a href="https://doi.org/10.5594/JMI.2024/NYYP7085" target="_blank" rel="noopener">https://doi.org/10.5594/JMI.2024/NYYP7085</a></span>

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Lakshmanan Gopishankar; Gamut Excursion Measurements (GEM)—Improving CIE Usage, MIJ 2024, Volume 133, Number 5 (pp. 16 to 23); SMPTE, 2024
doi: 10.5594/JMI.2024/NYYP7085
url: https://doi.org/10.5594/JMI.2024/NYYP7085

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<li>
Lakshmanan Gopishankar; <cite id="bib-10-5594-jmi-2024-nyyp7085">Gamut Excursion Measurements (GEM)—Improving CIE Usage</cite>, MIJ 2024, Volume 133, Number 5 (pp. 16 to 23); SMPTE, 2024
<span class="doi">10.5594/JMI.2024/NYYP7085</span>
</li>