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Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970)
[ACTIVE]

Electronically Generated Patterns for Testing Optical Systems

Metadata

Publisher
SMPTE — White Plains, NY, USA
Doc Type
Journal Article
Content Type
Original Research
Abbreviated Title
J SMPTE
Volume
79, No. 10, pp. 908–909
Abstract
One dimensional spatial waveforms having electrically controlled periodicity, waveshape and modulation depth are displayed on a cathode ray tube. Linear light modulation is achieved by gating a linearly scanned electron beam with constant amplitude, width and variable duty cycle pulses. Appropriate waveforms can be rapidly selected to evaluate the linearity, transient response or the steady state response of an optical system.
Publication Date
1970-10-01
DOI
10.5594/J13582
ISSN
Print: 0361-4573
Link
https://doi.org/10.5594/J13582
Author(s)
Earl F. BrownBell Telephone Laboratories, Inc., Holmdel, NJ 07738
William KaminskiBell Telephone Laboratories, Inc., Holmdel, NJ 07738
Copyright
© 1970 Society of Motion Picture and Television Engineers, Inc.

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Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at https://doi.org/10.5594/J13582
Snippet:
Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at https://doi.org/10.5594/J13582

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Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at https://doi.org/10.5594/J13582
Snippet:
<span class="citation">Earl F. Brown and William Kaminski; <cite>Electronically Generated Patterns for Testing Optical Systems</cite>, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at <a href="https://doi.org/10.5594/J13582" target="_blank" rel="noopener">https://doi.org/10.5594/J13582</a></span>

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Preview:
Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970
doi: 10.5594/J13582
url: https://doi.org/10.5594/J13582
Snippet:
<li>
Earl F. Brown and William Kaminski; <cite id="bib-10-5594-j13582">Electronically Generated Patterns for Testing Optical Systems</cite>, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970
<span class="doi">10.5594/J13582</span>
</li>