Electronically Generated Patterns for Testing Optical Systems
Metadata
- Publisher
- SMPTE
- Doc Type
- Journal Article
- Article Type
- research-article
- Abstract
- One dimensional spatial waveforms having electrically controlled periodicity, waveshape and modulation depth are displayed on a cathode ray tube. Linear light modulation is achieved by gating a linearly scanned electron beam with constant amplitude, width and variable duty cycle pulses. Appropriate waveforms can be rapidly selected to evaluate the linearity, transient response or the steady state response of an optical system.
- Publication Date
- 1970-10-01
- DOI
10.5594/J13582- Link
- https://doi.org/10.5594/J13582
- Author(s)
- Earl F. Brown, William Kaminski
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Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at https://doi.org/10.5594/J13582
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Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at https://doi.org/10.5594/J13582
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Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at https://doi.org/10.5594/J13582
Snippet:
<span class="citation">Earl F. Brown and William Kaminski; <cite>Electronically Generated Patterns for Testing Optical Systems</cite>, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970. Available at <a href="https://doi.org/10.5594/J13582" target="_blank" rel="noopener">https://doi.org/10.5594/J13582</a></span>
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Preview:
Earl F. Brown and William Kaminski; Electronically Generated Patterns for Testing Optical Systems, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970
doi: 10.5594/J13582
url: https://doi.org/10.5594/J13582
doi: 10.5594/J13582
url: https://doi.org/10.5594/J13582
Snippet:
<li> Earl F. Brown and William Kaminski; <cite id="bib-10-5594-j13582">Electronically Generated Patterns for Testing Optical Systems</cite>, Journal of the SMPTE ( Volume: 79, Issue: 10, October 1970); SMPTE, 1970 <span class="doi">10.5594/J13582</span> </li>