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SMPTE Journal ( Volume: 107, Issue: 2, February 1998)
[ACTIVE]

The dSam Depth of Field Test Chart

Metadata

Publisher
SMPTE — White Plains, NY, USA
Doc Type
Journal Article
Content Type
Original Research
Abbreviated Title
SMPTE J
Volume
107, No. 2, pp. 113–116
Abstract
The dSam Depth of Field Test Chart is a method for exploring and then assessing depth of field photographically by the use of a three-dimensional test chart which is based on a systematic optical-mathematical range of test chart distances and spatial frequency test targets on each test chart.
Publication Date
1998-02-01
DOI
10.5594/J18214XY
ISSN
Print: 0036-1682
Link
https://doi.org/10.5594/J18214XY
Author(s)
David Samuelson
Copyright
© 1998 Society of Motion Picture and Television Engineers, Inc.
Source Data (JSON)

Full registry record with provenance metadata. Open directly: /api/doc/10.5594-J18214XY.json

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David Samuelson; The dSam Depth of Field Test Chart, SMPTE Journal ( Volume: 107, Issue: 2, February 1998); SMPTE, 1998. Available at https://doi.org/10.5594/J18214XY
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David Samuelson; The dSam Depth of Field Test Chart, SMPTE Journal ( Volume: 107, Issue: 2, February 1998); SMPTE, 1998. Available at https://doi.org/10.5594/J18214XY

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David Samuelson; The dSam Depth of Field Test Chart, SMPTE Journal ( Volume: 107, Issue: 2, February 1998); SMPTE, 1998. Available at https://doi.org/10.5594/J18214XY
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<span class="citation">David Samuelson; <cite>The dSam Depth of Field Test Chart</cite>, SMPTE Journal ( Volume: 107, Issue: 2, February 1998); SMPTE, 1998. Available at <a href="https://doi.org/10.5594/J18214XY" target="_blank" rel="noopener">https://doi.org/10.5594/J18214XY</a></span>

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Preview:
David Samuelson; The dSam Depth of Field Test Chart, SMPTE Journal ( Volume: 107, Issue: 2, February 1998); SMPTE, 1998
doi: 10.5594/J18214XY
url: https://doi.org/10.5594/J18214XY
Snippet:
<li>
David Samuelson; <cite id="bib-10-5594-j18214xy">The dSam Depth of Field Test Chart</cite>, SMPTE Journal ( Volume: 107, Issue: 2, February 1998); SMPTE, 1998
<span class="doi">10.5594/J18214XY</span>
</li>