Sensitometric Control of the Duping Process
Metadata
- Publisher
- SMPTE
- Doc Type
- Journal Article
- Article Type
- research-article
- Abstract
- Because of head-and-tail development effects, sensitometric exposures of the standard type cannot be wholly relied upon to give a true indication of picture contrast. A method is described whereby sensitometric exposures of unusual form can be used to establish processing techniques for making dupes. Good correlation with visual judgment of quality of a standard picture is obtained.
- Publication Date
- 1946-12-01
- DOI
10.5594/J12743- Link
- https://doi.org/10.5594/J12743
- Author(s)
- J. P. Weiss
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J. P. Weiss; Sensitometric Control of the Duping Process, Journal of the Society of Motion Picture Engineers ( Volume: 47, Issue: 6, December 1946); SMPTE, 1946. Available at https://doi.org/10.5594/J12743
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J. P. Weiss; Sensitometric Control of the Duping Process, Journal of the Society of Motion Picture Engineers ( Volume: 47, Issue: 6, December 1946); SMPTE, 1946. Available at https://doi.org/10.5594/J12743
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J. P. Weiss; Sensitometric Control of the Duping Process, Journal of the Society of Motion Picture Engineers ( Volume: 47, Issue: 6, December 1946); SMPTE, 1946. Available at https://doi.org/10.5594/J12743
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<span class="citation">J. P. Weiss; <cite>Sensitometric Control of the Duping Process</cite>, Journal of the Society of Motion Picture Engineers ( Volume: 47, Issue: 6, December 1946); SMPTE, 1946. Available at <a href="https://doi.org/10.5594/J12743" target="_blank" rel="noopener">https://doi.org/10.5594/J12743</a></span>
SMPTE's HTML Pub
Preview:
J. P. Weiss; Sensitometric Control of the Duping Process, Journal of the Society of Motion Picture Engineers ( Volume: 47, Issue: 6, December 1946); SMPTE, 1946
doi: 10.5594/J12743
url: https://doi.org/10.5594/J12743
doi: 10.5594/J12743
url: https://doi.org/10.5594/J12743
Snippet:
<li> J. P. Weiss; <cite id="bib-10-5594-j12743">Sensitometric Control of the Duping Process</cite>, Journal of the Society of Motion Picture Engineers ( Volume: 47, Issue: 6, December 1946); SMPTE, 1946 <span class="doi">10.5594/J12743</span> </li>