Electronic Shutter Testers
Metadata
- Publisher
- SMPTE
- Doc Type
- Journal Article
- Article Type
- research-article
- Abstract
- The following paper, reprinted from Electronics, describes a photoelectric system which feeds a bank of stylii producing on Teledeltos paper a recording of camera shutter-opening area plotted against time, for testing both iris and focalplane shutters. Direct-indicating accessory shows per cent deviation from rated shutter speed. The editors of the Journal feel that the methods and equipment outlined here will be of timely interest to members in the motion picture industry and allied fields.
- Publication Date
- 1946-05-01
- DOI
10.5594/J11837- Link
- https://doi.org/10.5594/J11837
- Author(s)
- R. F. Redemske
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R. F. Redemske; Electronic Shutter Testers, Journal of the Society of Motion Picture Engineers ( Volume: 46, Issue: 5, May 1946); SMPTE, 1946. Available at https://doi.org/10.5594/J11837
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R. F. Redemske; Electronic Shutter Testers, Journal of the Society of Motion Picture Engineers ( Volume: 46, Issue: 5, May 1946); SMPTE, 1946. Available at https://doi.org/10.5594/J11837
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R. F. Redemske; Electronic Shutter Testers, Journal of the Society of Motion Picture Engineers ( Volume: 46, Issue: 5, May 1946); SMPTE, 1946. Available at https://doi.org/10.5594/J11837
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<span class="citation">R. F. Redemske; <cite>Electronic Shutter Testers</cite>, Journal of the Society of Motion Picture Engineers ( Volume: 46, Issue: 5, May 1946); SMPTE, 1946. Available at <a href="https://doi.org/10.5594/J11837" target="_blank" rel="noopener">https://doi.org/10.5594/J11837</a></span>
SMPTE's HTML Pub
Preview:
R. F. Redemske; Electronic Shutter Testers, Journal of the Society of Motion Picture Engineers ( Volume: 46, Issue: 5, May 1946); SMPTE, 1946
doi: 10.5594/J11837
url: https://doi.org/10.5594/J11837
doi: 10.5594/J11837
url: https://doi.org/10.5594/J11837
Snippet:
<li> R. F. Redemske; <cite id="bib-10-5594-j11837">Electronic Shutter Testers</cite>, Journal of the Society of Motion Picture Engineers ( Volume: 46, Issue: 5, May 1946); SMPTE, 1946 <span class="doi">10.5594/J11837</span> </li>