Methods of Appraising Photographic Systems

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Publisher: SMPTE
Doc Type: Journal Article
Article Type: research-article
Abstract: Reasons for the unsuitability of resolving power as a criterion of the performance of an optical or photographic system in general are outlined and the newer concepts of acutance and spread function are introduced. The method of computing the edge trace from the spread function is described. The procedure known as convolution is introduced and exemplified by computing the image of a sinusoidal test object. It is shown that such an image is also sinusoidal and of the same frequency as the object but of different modulation and phase and that the properties of such an image give rise to the concept of sine-wave response.
Publication Date: 1960-03-01
DOI: 10.5594/J10962
Link: https://doi.org/10.5594/J10962
Author(s): Fred H. Perrin

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Fred H. Perrin; Methods of Appraising Photographic Systems, Journal of the SMPTE ( Volume: 69, Issue: 3, March 1960); SMPTE, 1960. Available at https://doi.org/10.5594/J10962

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Fred H. Perrin; Methods of Appraising Photographic Systems, Journal of the SMPTE ( Volume: 69, Issue: 3, March 1960); SMPTE, 1960. Available at https://doi.org/10.5594/J10962

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Fred H. Perrin; Methods of Appraising Photographic Systems, Journal of the SMPTE ( Volume: 69, Issue: 3, March 1960); SMPTE, 1960. Available at https://doi.org/10.5594/J10962

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<span class="citation">Fred H. Perrin; <cite>Methods of Appraising Photographic Systems</cite>, Journal of the SMPTE ( Volume: 69, Issue: 3, March 1960); SMPTE, 1960. Available at <a href="https://doi.org/10.5594/J10962" target="_blank" rel="noopener">https://doi.org/10.5594/J10962</a></span>

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Fred H. Perrin; Methods of Appraising Photographic Systems, Journal of the SMPTE ( Volume: 69, Issue: 3, March 1960); SMPTE, 1960
doi: 10.5594/J10962
url: https://doi.org/10.5594/J10962

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<li>
Fred H. Perrin; <cite id="bib-10-5594-j10962">Methods of Appraising Photographic Systems</cite>, Journal of the SMPTE ( Volume: 69, Issue: 3, March 1960); SMPTE, 1960
<span class="doi">10.5594/J10962</span>
</li>