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Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972)
[ACTIVE]

The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality

Metadata

Publisher
SMPTE — White Plains, NY, USA
Doc Type
Journal Article
Content Type
Original Research
Abbreviated Title
J SMPTE
Volume
81, No. 12, pp. 924–925
Abstract
Three phenomena are described which can affect the quality of color films even though the film and process are on target. These are reciprocity failure, exposure plane temperature and solar altitude.
Publication Date
1972-12-01
DOI
10.5594/J08183
ISSN
Print: 0361-4573
Link
https://doi.org/10.5594/J08183
Author(s)
John F. ReinhardFilm Technical Services Div., Eastman Kodak Co., Kodak Park Div., 343 State St., Rochester, NY 14650
John W. ZuidemaFilm Technical Services Div., Eastman Kodak Co., Kodak Park Div., 343 State St., Rochester, NY 14650
Copyright
© 1972 Society of Motion Picture and Television Engineers, Inc.
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John F. Reinhard and John W. Zuidema; The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality, Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972); SMPTE, 1972. Available at https://doi.org/10.5594/J08183
Snippet:
John F. Reinhard and John W. Zuidema; The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality, Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972); SMPTE, 1972. Available at https://doi.org/10.5594/J08183

HTML (ISO 690 compliant)

Preview:
John F. Reinhard and John W. Zuidema; The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality, Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972); SMPTE, 1972. Available at https://doi.org/10.5594/J08183
Snippet:
<span class="citation">John F. Reinhard and John W. Zuidema; <cite>The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality</cite>, Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972); SMPTE, 1972. Available at <a href="https://doi.org/10.5594/J08183" target="_blank" rel="noopener">https://doi.org/10.5594/J08183</a></span>

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Preview:
John F. Reinhard and John W. Zuidema; The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality, Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972); SMPTE, 1972
doi: 10.5594/J08183
url: https://doi.org/10.5594/J08183
Snippet:
<li>
John F. Reinhard and John W. Zuidema; <cite id="bib-10-5594-j08183">The Effects of Exposure Plane Temperature, Reciprocity Failure and Solar Altitude on Photographic Quality</cite>, Journal of the SMPTE ( Volume: 81, Issue: 12, December 1972); SMPTE, 1972
<span class="doi">10.5594/J08183</span>
</li>

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