A Comparison of Alternative High-Definition Display Technologies to CRT

Metadata

Publisher: SMPTE — White Plains, NY, USA
Doc Type: Journal Article
Content Type: Original Research
Abbreviated Title: SMPTE J
Volume: 109, No. 8, pp. 636–647
Abstract: Over the past 18 months, high-definition (HD) home entertainment systems have become available to the U.S. consumer, albeit with a substantial price tag. These systems are based almost exclusively on direct view and rear projection cathode ray tube (CRT) technology. More recently however, a number of manufacturers have made announcements portending the arrival of high-definition television (HDTV) projection systems based on alternative display technologies such as transmissive and reflective liquid crystal display (LCD), and digital light processor (DLP) technology. Many of these announcements promise excellent image quality, but demonstrations of prototype systems have shown that there is much variability in subjective image quality from system to system. This paper examines some of the image quality characteristics of representative samples of several LCD and DLP-based projection display technologies as compared to those of CRT-based HD sets. Modulation transfer function (MTF) characteristics are compared, as well as quantitative image quality metrics, using several established methods.
Publication Date: 2000-08-01
DOI: 10.5594/J05272
ISSN: Print: 0036-1682
Link: https://doi.org/10.5594/J05272
Author(s): Peter F. van KesselPeter van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt are with Texas Instruments, Plano, TX 75086.
bio
Peter van Kessel received a BSEE from the University of Pennsylvania in 1983. He is currently a member of the technical staff in the Digital Imaging Group at Texas Instruments. He spent 11 years on the staff of the electro-optics groups at TI and at Martin Marietta, performing a wide variety of design and systems engineering activities on state of the art military electro-optics systems. Since 1996 van Kessel has managed the DMD design department at Texas Instruments. He is currently responsible for the design of all development and production DMDs, pixel architectures, and algorithm development. Van Kessel is an active member of the SID, SPIE, IEEE, and SMPTE.
Terry A. BartlettPeter van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt are with Texas Instruments, Plano, TX 75086.
bio
Terry Bartlett is currently an optical systems analyst and member of the group technical staff in the Digital Imaging Technology Development Organization at Texas Instruments (TI). Since joining TI he has developed mathematical and computer simulation models to predict and optimize optical and colon-metric performance of advanced digital light processing (DLP) systems. In addition, he has developed models for estimating scatter/diffraction from DMD pixel structures useful in predicting contrast ratio. He also developed the advanced infrared electro-optical architectures and algorithms for military applications. Bartlett has an MSEE degree from Southern Methodist University and a BSEE degree from the University of Michigan.
Scott DewaldPeter van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt are with Texas Instruments, Plano, TX 75086.
bio
Scott Dewald received a B.S. in aerospace engineering from the University of Michigan, Ann Arbor, in 1983, and an M.S. in mechanical engineering from UCLA in 1986. He has worked in several optics disciplines, including infrared sensing, laser rangefinding, solid-state laser design, laser displays, holographic data storage, semiconductor wafer inspection, and LCD and DLP projection displays. Dewald currently manages the Optics Technology group of Texas Instrument's Digital Imaging.
Gregory S. PettittPeter van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt are with Texas Instruments, Plano, TX 75086.
bio
Gregory S. Pettitt received B.S. and M.S. degrees in electrical engineering from Oklahoma State University in 1982 and 1983, respectively. He joined Texas Instruments in 1984 and worked as a system engineer in IR tracking systems. Pettitt joined the TI Digital Imaging Group in 1993, where he is currently a senior member of the technical staff working in the areas of color science, image processing, image quality analysis, and projection system modeling.
Copyright: © 2000 Society of Motion Picture and Television Engineers, Inc.

Bibliographic Reference(s)

Image Quality: A Comparison of Photographic and Television Systems [Active]
1. Sherr Sol , Electronic Displays , 2nd Ed. , John Wiley & Sons, Inc. : New York, NY , 1993 . EXTERNAL
2. Biberman L. C. , Image Quality, in Perception of Displayed Information , Plenum Press : New York, NY , 1973 . EXTERNAL
3. Holst G. C. , Sampling, Aliasing and Data Fidelity for Electronic Imaging Systems, Communications and Data Acquisition Systems , JCD Publishing : Winter Park, FL , 1998 . EXTERNAL
4. Gonzalez R. C. Wintz P. , Digital Image Processing , Addison-Wesley Publishing Co. : Reading, MA , 1977 . EXTERNAL
6. Barten P. G. J. , “The SQRI Method: A New Method for the Evaluation of Visible Resolution on a Display,” Proceedings of the SID . 28/3 : 253 – 262 , 1987 . EXTERNAL

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Peter F. van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt; A Comparison of Alternative High-Definition Display Technologies to CRT, SMPTE Journal ( Volume: 109, Issue: 8, August 2000); SMPTE, 2000. Available at https://doi.org/10.5594/J05272

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Peter F. van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt; A Comparison of Alternative High-Definition Display Technologies to CRT, SMPTE Journal ( Volume: 109, Issue: 8, August 2000); SMPTE, 2000. Available at https://doi.org/10.5594/J05272

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<span class="citation">Peter F. van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt; <cite>A Comparison of Alternative High-Definition Display Technologies to CRT</cite>, SMPTE Journal ( Volume: 109, Issue: 8, August 2000); SMPTE, 2000. Available at <a href="https://doi.org/10.5594/J05272" target="_blank" rel="noopener">https://doi.org/10.5594/J05272</a></span>

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Peter F. van Kessel, Terry A. Bartlett, Scott Dewald, and Gregory S. Pettitt; <cite id="bib-10-5594-j05272">A Comparison of Alternative High-Definition Display Technologies to CRT</cite>, SMPTE Journal ( Volume: 109, Issue: 8, August 2000); SMPTE, 2000
<span class="doi">10.5594/J05272</span>
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