Development of a 3-MOS Color Camera

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Publisher: SMPTE
Doc Type: Journal Article
Article Type: research-article
Abstract: This article describes a 3-chip color camera using high-resolution metal oxide semiconductor (MOS) imaging devices. Fixed pattern noise and vertical smear, which were serious drawbacks of the MOS camera, have been reduced to a minimum by newly developed suppression circuits. By cementing three devices onto the prism surfaces, registration accuracy of better than 0.05% is achieved permanently. The camera provides horizontal resolution of 450 TV lines and signal-to-noise ratio of 49 dB at 2000 lux, and is suitable for many broadcast ENG applications.
Publication Date: 1983-12-01
DOI: 10.5594/J04214
Link: https://doi.org/10.5594/J04214
Author(s): Nobuo Murata, Chikafusa Hirano, Masaharu Ohoka, Shusaku Nagahara

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Nobuo Murata, Chikafusa Hirano, Masaharu Ohoka, and Shusaku Nagahara; Development of a 3-MOS Color Camera, SMPTE Journal ( Volume: 92, Issue: 12, December 1983); SMPTE, 1983. Available at https://doi.org/10.5594/J04214

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Nobuo Murata, Chikafusa Hirano, Masaharu Ohoka, and Shusaku Nagahara; Development of a 3-MOS Color Camera, SMPTE Journal ( Volume: 92, Issue: 12, December 1983); SMPTE, 1983. Available at https://doi.org/10.5594/J04214

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<span class="citation">Nobuo Murata, Chikafusa Hirano, Masaharu Ohoka, and Shusaku Nagahara; <cite>Development of a 3-MOS Color Camera</cite>, SMPTE Journal ( Volume: 92, Issue: 12, December 1983); SMPTE, 1983. Available at <a href="https://doi.org/10.5594/J04214" target="_blank" rel="noopener">https://doi.org/10.5594/J04214</a></span>

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Nobuo Murata, Chikafusa Hirano, Masaharu Ohoka, and Shusaku Nagahara; Development of a 3-MOS Color Camera, SMPTE Journal ( Volume: 92, Issue: 12, December 1983); SMPTE, 1983
doi: 10.5594/J04214
url: https://doi.org/10.5594/J04214

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<li>
Nobuo Murata, Chikafusa Hirano, Masaharu Ohoka, and Shusaku Nagahara; <cite id="bib-10-5594-j04214">Development of a 3-MOS Color Camera</cite>, SMPTE Journal ( Volume: 92, Issue: 12, December 1983); SMPTE, 1983
<span class="doi">10.5594/J04214</span>
</li>