Avoiding the Pitfalls in Serial Digital Signal Distribution
Metadata
- Publisher
- SMPTE
- Doc Type
- Journal Article
- Article Type
- research-article
- Abstract
- Serial digital video systems tolerate transmission line distortions and noise up to a certain noise or distortion threshold. Above this threshold the bit-error rate increases very rapidly and the system fails. This article discusses how jitter can accumulate through distribution amplifiers (DAs) and switchers. It gives an overview of the serial digital video signal, identifies its failure modes, tells how it is processed, and suggests some test methods and equipment that might be used to determine if a system component is on the verge of failure.
- Publication Date
- 1993-01-01
- DOI
10.5594/J02145- Link
- https://doi.org/10.5594/J02145
- Author(s)
- Ron Ward
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Ron Ward; Avoiding the Pitfalls in Serial Digital Signal Distribution, SMPTE Journal ( Volume: 102, Issue: 1, January 1993); SMPTE, 1993. Available at https://doi.org/10.5594/J02145
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Ron Ward; Avoiding the Pitfalls in Serial Digital Signal Distribution, SMPTE Journal ( Volume: 102, Issue: 1, January 1993); SMPTE, 1993. Available at https://doi.org/10.5594/J02145
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Ron Ward; Avoiding the Pitfalls in Serial Digital Signal Distribution, SMPTE Journal ( Volume: 102, Issue: 1, January 1993); SMPTE, 1993. Available at https://doi.org/10.5594/J02145
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<span class="citation">Ron Ward; <cite>Avoiding the Pitfalls in Serial Digital Signal Distribution</cite>, SMPTE Journal ( Volume: 102, Issue: 1, January 1993); SMPTE, 1993. Available at <a href="https://doi.org/10.5594/J02145" target="_blank" rel="noopener">https://doi.org/10.5594/J02145</a></span>
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Preview:
Ron Ward; Avoiding the Pitfalls in Serial Digital Signal Distribution, SMPTE Journal ( Volume: 102, Issue: 1, January 1993); SMPTE, 1993
doi: 10.5594/J02145
url: https://doi.org/10.5594/J02145
doi: 10.5594/J02145
url: https://doi.org/10.5594/J02145
Snippet:
<li> Ron Ward; <cite id="bib-10-5594-j02145">Avoiding the Pitfalls in Serial Digital Signal Distribution</cite>, SMPTE Journal ( Volume: 102, Issue: 1, January 1993); SMPTE, 1993 <span class="doi">10.5594/J02145</span> </li>