Why Participate in International Standards

Metadata

Publisher: SMPTE
Doc Type: Journal Article
Article Type: research-article
Abstract: This article is the first in a series of editorials in which the SMPTE invites an authority to comment on the relationship of the SMPTE to the business, scientific and socio-economic communities. In this article, the author offers his Point of View on the effect of American and international standardization on the marketplace as well as the international business community at large. In short, he addresses the question, “What is the value of standardization?”
Publication Date: 1981-04-01
DOI: 10.5594/J00410
Link: https://doi.org/10.5594/J00410
Author(s): Alex E. Alden

Source Data (JSON)

Full registry record with provenance metadata. Open directly: /api/doc/10.5594-J00410.json

Reference this Doc

Plain text (ISO 690 compliant)

Preview:

Alex E. Alden; Why Participate in International Standards, SMPTE Journal ( Volume: 90, Issue: 4, April 1981); SMPTE, 1981. Available at https://doi.org/10.5594/J00410

Snippet:

Alex E. Alden; Why Participate in International Standards, SMPTE Journal ( Volume: 90, Issue: 4, April 1981); SMPTE, 1981. Available at https://doi.org/10.5594/J00410

HTML (ISO 690 compliant)

Preview:

Alex E. Alden; Why Participate in International Standards, SMPTE Journal ( Volume: 90, Issue: 4, April 1981); SMPTE, 1981. Available at https://doi.org/10.5594/J00410

Snippet:

<span class="citation">Alex E. Alden; <cite>Why Participate in International Standards</cite>, SMPTE Journal ( Volume: 90, Issue: 4, April 1981); SMPTE, 1981. Available at <a href="https://doi.org/10.5594/J00410" target="_blank" rel="noopener">https://doi.org/10.5594/J00410</a></span>

SMPTE's HTML Pub

Preview:

Alex E. Alden; Why Participate in International Standards, SMPTE Journal ( Volume: 90, Issue: 4, April 1981); SMPTE, 1981
doi: 10.5594/J00410
url: https://doi.org/10.5594/J00410

Snippet:

<li>
Alex E. Alden; <cite id="bib-10-5594-j00410">Why Participate in International Standards</cite>, SMPTE Journal ( Volume: 90, Issue: 4, April 1981); SMPTE, 1981
<span class="doi">10.5594/J00410</span>
</li>