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  "docId": "10.5594-j18618",
  "document": {
    "abbrevTitle": "SMPTE Mot. Imag J.",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "abstract": "In April 2014 a new family of high-efficiency video coding (HEVC) profiles named “range extensions” was approved in order to cover the needs of high-quality production environments, such as primary distribution, contribution services, and editing/post-production.1 HEVC range extensions support the 4:2:2 and 4:4:4 chroma subsampling formats and pixel depths beyond 10 bits, using the same coding tools as the first version of HEVC. The new “Main 422@10” HEVC profile will become the successor of the successful “High 422” profile of the H.264/advanced video coding (AVC) standard, achieving a high efficiency for emerging formats beyond high definition (HD), such as the 4K and 8K formats.2 HD interlaced content is currently the mainstream for broadcasting production, but HEVC profiles do not include specific tools for interlaced content as H.264/AVC did. This paper addresses the issues involved in HD interlaced contribution services under the HEVC Main 422@10 profile, with the aim to identify its real HEVC efficiency in comparison to the High 422P profile of H.264/AVC. The simulation results will report the bandwidth savings and other quality improvements that broadcasters and network operators can achieve for HD interlacing encoding using the new HEVC profiles.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "articleType": "orig-research",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "authors": [
      "Juan Jose Anaya",
      "Damian Ruiz"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "year": "2015",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docId": "10.5594-j18618",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/j18618",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docLabel": "SMPTE Motion Imaging Journal ( Volume: 124, Issue: 7, October 2015)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docTitle": "HEVC Efficiency Assessment for Contribution Services of HD Interlaced Content",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "journal_metadata XML — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "doi": "10.5594/j18618",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "href": "https://doi.org/10.5594/j18618",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/j18618",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "issn": {
      "electronic": "2160-2492",
      "electronic$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "print": "1545-0279",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "7",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "pages": "1–13",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publicationDate": "2015-10-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from publisher-name (SMPTE)",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "high",
        "note": "Mapped from article_status=\"active\"",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "volume": "124",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12407-mijr-2015/MIJR124Vol124No7-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    }
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}