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  "docId": "10.5594-j18529",
  "document": {
    "abbrevTitle": "SMPTE Mot. Imag J.",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "abstract": "The introduction of ultra-high-definition (UHD) televisions (TVs) will build upon the growing consumer desire for the highest TV image quality possible. The new high-efficiency video coding (HEVC) standard (H.265, MPEG-H Part 2) provides the most bandwidth-efficient delivery of HD and UHD content. HEVC was standardized in early 2013 but addressed only consumer applications. In mid-2014, the HEVC range extensions (RExt) profiles were standardized to address professional applications. This article describes “true” 4K UHDTV and how it achieves a greater immersive viewing experience than today’s HDTV. The article then explores the HEVC tool enhancements for contribution and distribution applications, focusing on the 4:2:2 10-bit and 4:2:0 10-bit formats. To give a sense of picture quality versus bandwidth requirements, three experimental lab tests are discussed: UHDTV1 (3840 x 2160) content is HEVC-compressed and compared with a downscaled 1080p HD version that is HEVC-compressed and then upscaled back to UHDTV1 resolution, HEVC RExt is compared against advanced video coding Fidelity Range Extensions for UHDTV1, and the impact of higher frame rates on the bit rate required for UHDTV1 is investigated.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "articleType": "orig-research",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "authors": [
      "Matthew S. Goldman",
      "Lukasz Litwic",
      "Olie Baumann"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "year": "2015",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docId": "10.5594-j18529",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/j18529",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docLabel": "SMPTE Motion Imaging Journal ( Volume: 124, Issue: 3, April 2015)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docTitle": "ULTRA-HD Content Acquisition and Exchange Using HEVC Range Extensions",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "journal_metadata XML — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "doi": "10.5594/j18529",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "href": "https://doi.org/10.5594/j18529",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/j18529",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "issn": {
      "electronic": "2160-2492",
      "electronic$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "print": "1545-0279",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "3",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "pages": "28–36",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publicationDate": "2015-04-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from publisher-name (SMPTE)",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "high",
        "note": "Mapped from article_status=\"active\"",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "volume": "124",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press To Load After Xplore Release/12403-mijr-2015/MIJR124Vol124No3-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    }
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}