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  "docId": "10.5594-j18485",
  "document": {
    "abbrevTitle": "SMPTE Mot. Imag J.",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "abstract": "For digital camera systems, transforming from the native camera RGB signals into an intermediate working space is often required, with common examples involving transformations into the Academy Encoding Specification (ACES) or XYZ. For scene-linear camera signals, by far the most common approach utilizes 3 x 3 matrices (formed using regression methods), which are low-complexity approximations to the exact transformation that would be obtained using a full spectral analysis. For workflows designed for Rec. 709 displays, matrix-based input transforms are capable of producing reasonable accuracy in this domain. However, the 3 x 3 matrix colorimetric errors can become significant for saturated colors in workflows involving wide-gamut primary systems such as UHDTV or ACES. To address this shortfall, a novel input color transformation method has been developed that involves separate one-dimensional and two-dimensional operations. From the native camera RGB signals, chromaticity-like coordinates are computed, and these are used to index into a two-dimensional lookup table (LUT); the output of the two-dimensional LUT is then scaled according to the input signal. Because the surfaces associated with the two-dimensional LUTs possess many degrees of freedom, highly accurate colorimetric transformations can be achieved. For several cinematic and broadcast cameras tested, this new transformation method consistently shows a modest reduction of mean ΔE errors for colors within the Rec. 709 primaries. The improvement in accuracy becomes much more significant for saturated colors, for which the mean ΔE errors are reduced by more than a factor of three for colors that lie between Rec. 709 and Rec. 2020.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "articleType": "orig-research",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "authors": [
      "Jon S. McElvain",
      "Walter Gish"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "year": "2014",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docId": "10.5594-j18485",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/j18485",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docLabel": "SMPTE Motion Imaging Journal ( Volume: 123, Issue: 8, November 2014)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docTitle": "High-Accuracy Digital Camera Color Transforms for Wide-Gamut Workflows",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "journal_metadata XML — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "doi": "10.5594/j18485",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "href": "https://doi.org/10.5594/j18485",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/j18485",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "issn": {
      "electronic": "2160-2492",
      "electronic$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "print": "1545-0279",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "8",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "pages": "33–40",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publicationDate": "2014-11-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from publisher-name (SMPTE)",
      "source": "inferred",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "high",
        "note": "Mapped from article_status=\"active\"",
        "source": "parsed",
        "updated": "2026-05-22T23:54:08.922Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "volume": "123",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/ALLEN PRESS/DELIVERED TO IEEEE/Allen Press source from FTP/12308-mijr-2015/MIJR123Vol123No8-issue-metadata.xml)",
      "source": "parsed",
      "updated": "2026-05-22T23:54:08.922Z",
      "version": "smpte-journal-issue-xml@v1"
    }
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}