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  "docId": "10.5594-M00681",
  "document": {
    "abstract": "The Format Convertor (FC) was devised by the Advanced Television Test Center (ATTC) as a means of recording source and output video for the Advanced Television (ATV) standards being evaluated by ATTC and the FCC. Tektronix Laboratories was asked by ATTC to design and build the FC. Used in conjunction with a DVTR intended for the 1125 line system, the FC orthogonally samples the user's signal and sends a stream of samples formatted as a digital 1125 line signal to the DVTR. In actuality, a line of digital video as seen by the DVTR may contain more or less than one line of samples of the user's signal. When the digital video signal is played back from the recorder, the FC reformats the sample stream into the user's standard. Automatic user format detection by the FC permits intermixing of formats on the same tape. User standards include 525 and 787-788 line progressive and 1050 and 1125 line interlaced standards at either 59.94 or 60 Hz field rates. The architecture is extensible to include operation where the field rate of the user standard differs from that of the recorder in small integer ratios.",
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      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "authors": [
      {
        "affiliation": "Tektronix, Inc. Beaverton",
        "name": "Philip S. Crosby"
      },
      {
        "affiliation": "Advanced Television Test Center, Alexandria, VA",
        "name": "Charles W. Rhodes"
      }
    ],
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    "contentType": "orig-research",
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      "confidence": "high",
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      "updated": "2026-07-09T19:12:47.628Z",
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      "holder": "Society of Motion Picture and Television Engineers, Inc.",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
        "source": "parsed",
        "updated": "2026-05-22T21:44:19.125Z",
        "version": "smpte-conference-paper-nlm@v1"
      },
      "year": "1993",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
        "source": "parsed",
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    },
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
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      "updated": "2026-05-22T21:44:19.125Z",
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    "docId": "10.5594-M00681",
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      "confidence": "high",
      "note": "Derived from DOI 10.5594/M00681",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "docLabel": "SMPTE Meetings and Conferences ( February 1993)",
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      "note": "Composed from venue title, volume/issue and date",
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      "version": "smpte-conference-paper-nlm@v1"
    },
    "docTitle": "Use of the ATTC/Tektronix Format Converter in ATV Testing",
    "docTitle$meta": {
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      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
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      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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      "note": "NLM <article> — SMPTE conference paper",
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      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "doi": "10.5594/M00681",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
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      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "href": "https://doi.org/10.5594/M00681",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/M00681",
      "source": "inferred",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "number": "23",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "pages": "135–139",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
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      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "publicationDate": "1993-02-01",
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      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-conference-paper-nlm@v1"
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    "publisherLocation": {
      "city": "White Plains, NY",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
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    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptem/10.5594_M00681.xml)",
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    "resolvedHref": "https://journal.smpte.org/conferences/Advanced%20Television%20and%20Electronic%20Imaging%20for%20Film%20and%20Video:%20SMPTE%20Advanced%20Television%20Imaging%20Conference/15/",
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      "confidence": "high",
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      "originalValue": null,
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        "confidence": "medium",
        "note": "No explicit status in NLM source — conference papers default active",
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        "updated": "2026-05-22T21:44:19.125Z",
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    "volume": "1993",
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