{
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  "docId": "10.5594-J16706",
  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "Waveform testing methods are commonly used to determine the performance of video channels.1,2 These testing methods use the distortion introduced by a channel on a specified test signal as a measure of channel performance. Results are presented of a study on using a 2 T pulse, a waveform that has received increased attention in the U.S. for the evaluation of linear distortion, and an oscilloscope graticule to interpret the pulse response in terms of K-rating for NTSC systems. The K-rating method specifies the performance of a channel in terms of a K-rating factor, which is given in per cent and represents a degree of subjective picture impairment equivalent to that occurring in a channel having a single well-displaced echo of K%. The recent study found that the use of a scaled 2 T pulse graticule on NTSC systems may result in K-ratings that are high by a factor of 1.8. A modified 2 T pulse K-rating graticule based on subjective test data using NTSC signals is presented that maintains the one-to-one correspondence between K-rating and picture impairment caused by a single echo.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "Robert E. Mallon"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
        "source": "parsed",
        "updated": "2026-05-22T21:44:19.125Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1970",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
        "source": "parsed",
        "updated": "2026-05-22T21:44:19.125Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J16706",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J16706",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "Journal of the SMPTE ( Volume: 79, Issue: 1, January 1970)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from venue title, volume/issue and date",
      "source": "inferred",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Application of K-Rating to USA NTSC Systems",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J16706",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J16706",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J16706",
      "source": "inferred",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0361-4573",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
        "source": "parsed",
        "updated": "2026-05-22T21:44:19.125Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_79_1/MIJR15Vol79No1.xml)",
      "source": "parsed",
      "updated": "2026-06-17T00:17:09.425Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "1",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "16–21",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1970-01-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
        "source": "parsed",
        "updated": "2026-05-22T21:44:19.125Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_79_1/MIJR15Vol79No1.xml)",
        "source": "parsed",
        "updated": "2026-06-17T00:17:09.425Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal papers default active",
        "source": "inferred",
        "updated": "2026-05-22T21:44:19.125Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "volume": "79",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16706.xml)",
      "source": "parsed",
      "updated": "2026-05-22T21:44:19.125Z",
      "version": "smpte-journal-article-nlm@v1"
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}