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    "abbrevTitle": "SMPTE J",
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    "abstract": "Analog video is on the way out, so why study it at all? Many digital television standards evolved from analog video standards. To have a complete understanding of standards, it is necessary to understand why the choices were made to create standards for today's digital video. Why do we have interlace in the first place and why should it be considered in digital video; what problem did the color difference signal (R-Y and B-Y) solve, and why was it chosen for today's digital system? These and other concepts are briefly discussed in this paper.",
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    "authors": [
      {
        "bio": "Wayne McLachlan has been with Grass Valley Group (Tektronix) in a number of different capacities for the past 25 1/2 years. He is co-author of “Applied Electronic Instrumentation and Measurement” and has authored several application booklets on video testing methods, including “Comprehensive Video Test Methods,” a guide used by Grass Valley Group and Tektronix for 20 years. He is an active member of SMPTE and is Past Chairman of the Sacramento Section. McLachlan has taught a two-seminar course in advanced communications technology at Yuba College with emphasis on video broadcasting. Since 1980, he has taught Introduction to Broadcast Video—Principles and Measurment, a very popular course from which he has compiled a 12-volume videotape series. He is currently teaching a short course series in Digital Video Compression, at UCLA.",
        "name": "Wayne McLachlan"
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    "contentType": "orig-research",
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      "year": "2001",
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        "confidence": "high",
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    "docLabel": "SMPTE Journal ( Volume: 110, Issue: 3, March 2001)",
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    "docTitle": "Analog Video 101 and 102 for All",
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    "doi": "10.5594/J16467",
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    "href": "https://doi.org/10.5594/J16467",
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    "issn": {
      "print": "0036-1682",
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    "journalAcronym": "MIJR",
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      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_110_3/MIJR15Vol110No3.xml)",
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    "number": "3",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J16467.xml)",
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    "pages": "151–157",
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      "confidence": "high",
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      "country": "USA",
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        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_110_3/MIJR15Vol110No3.xml)",
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      "confidence": "high",
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