{
  "$schema": "/api/schemas/documents.schema.json",
  "apiVersion": "1.0.0",
  "generatedAt": "2026-06-17T23:49:39.838Z",
  "sourcePath": "src/main/data/docs",
  "docId": "10.5594-J14835",
  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "A 15-20 min recharging system for sealed cylindrical flashlight-type nickel-cadmium batteries is now available for electronic newsgathering and other applications. This ReFLEX-20 charger can recharge various sizes of battery packs—sub C, D and larger and offers the advantages of greatly reduced recharging time, negligible battery capacity fading, and up to 10 times longer battery cycle life. The principle of “ReFLEX charging” is to alternate high-energy charging periods with automatically varying lower-energy discharge pulses that in effect act as “burps.” The ReFLEX-20 system, which also includes specially manufactured and matched batteries, complements the larger ReFLEX charger which has been used for some years to recharge aircraft sintered and vented nickel-cadmium batteries. Five significant problems that are encountered with sealed nickel-cadmium batteries and conventional chargers are overcome with the ReFLEX-20 system.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "Fred Benjamin"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1977",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J14835",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J14835",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "SMPTE Journal ( Volume: 86, Issue: 4, April 1977)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from venue title, volume/issue and date",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "System for 20-Min Recharging of Sealed Nickel-Cadmium Batteries",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J14835",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J14835",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J14835",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0036-1682",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_86_4/MIJR15Vol86No4.xml)",
      "source": "parsed",
      "updated": "2026-06-17T00:17:09.425Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "4",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "204–209",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1977-04-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_86_4/MIJR15Vol86No4.xml)",
        "source": "parsed",
        "updated": "2026-06-17T00:17:09.425Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal papers default active",
        "source": "inferred",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "volume": "86",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14835.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    }
  }
}