{
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  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "abstract": "A Kerr electrooptical technique that permits direct observation and mapping of distorted high-intensity electric fields has been devised at NBS. Analysis of the field profile from two-dimensional fringe images, similar to those observed in photo-elastic mechanical stress analysis, permits calibration of the Kerr System for measurement of high-voltage pulses, and determination of relative field strength, actual field strength, and potential.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "E. C. Cassidy",
      "H. N. Cones"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1970",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J14318",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J14318",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "Journal of the SMPTE ( Volume: 79, Issue: 7, July 1970)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from venue title, volume/issue and date",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Use of Expanded Laser Beam to Analyze High-Intensity Electric Fields",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J14318",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J14318",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J14318",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "issn": {
      "print": "0361-4573",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
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    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_79_7/MIJR15Vol79No7.xml)",
      "source": "parsed",
      "updated": "2026-06-16T18:14:32.753Z",
      "version": "smpte-journal-issue-xml@v1"
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    "number": "7",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "590–591",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publicationDate": "1970-07-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_79_7/MIJR15Vol79No7.xml)",
        "source": "parsed",
        "updated": "2026-06-16T18:14:32.753Z",
        "version": "smpte-journal-issue-xml@v1"
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    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal papers default active",
        "source": "inferred",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
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    "volume": "79",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14318.xml)",
      "source": "parsed",
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