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    "abbrevTitle": "SMPTE J",
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      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "abstract": "Return loss is signal attenuation caused by impedance variations in the structure of a cable or associated connection parts. These variations cause the signal to reflect (return) back to the source. At lower frequencies, return loss is a minor effect; at frequencies above 50 MHz, it can have a significant effect; and at frequencies used for high-definition video, 1500 MHz and higher, it can be a major, even critical, factor. For this reason it is suggested that return loss be a key consideration in the measurement and verification of HD system performance.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
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    "authors": [
      {
        "affiliation": "Belden Electronics Division, Richmond, IN 47374",
        "bio": "Stephen H. Lampen has been with Belden for nine years and is currently technology specialist, multimedia products for Belden Electronics Division. He is an SBE certified radio broadcast engineer and a BICSI registered communication distribution designer. Lampen holds an FCC Lifetime General License, and previous to Belden was an engineer and chief engineer for a number of radio stations and other broadcast facilities in the San Francisco Bay Area. He also worked in the motion picture industry and recording studios. Lampen is a member of SMPTE, SBE, and AES. He writes monthly columns for Radio World and CEPro magazines. He has also published a book, “Wire, Cable, and Fiber Optics for Video and Audio Engineers.”",
        "name": "Stephen H. Lampen"
      },
      {
        "affiliation": "Belden Electronics Division, Richmond, IN 47374",
        "bio": "Martin J. Van Der Burgt is a senior product engineering project manager at the Belden Engineering Center. He holds a BSEE degree from Marquette University and has been with Belden for eight years. His experience encompasses project management and product development positions. Currently he is responsible for all design and development issues within the audio/video and industrial product areas. Van Der Burgt is a member of IEEE and SMPTE, and also holds a FCC Amateur Extra Class Radio License.",
        "name": "Martin J. Van Der Burgt"
      },
      {
        "affiliation": "Belden Electronics Division, Richmond, IN 47374",
        "bio": "Carl W. Dole is an associate product engineer and has been at the Belden Engineering Center for over ten years. He graduated “with highest distinction” in December 2000, with a B.S. degree in electrical engineering technology from Purdue University. Prior to joining Belden, Dole worked ten years in television broadcast engineering and has a FCC General Class Radiotelephone License. Presently he is working on developing improved electrical test methodologies and new product developments for Belden. He is a member of SMPTE, IEEE, and SBE.",
        "name": "Carl W. Dole"
      }
    ],
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      "confidence": "high",
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      "updated": "2026-06-23T00:04:25.562Z",
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    "contentType": "orig-research",
    "contentType$meta": {
      "confidence": "high",
      "note": "Cross-filled from SMPTE canonical repository import (smpte-canonical-audit/canonicalLibrary.*.json); previous value was a placeholder",
      "originalValue": "other",
      "source": "parsed",
      "updated": "2026-07-07T23:39:31.295Z",
      "version": "smpte-canonical-repo@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "2001",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
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    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J14160",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J14160",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "SMPTE Journal ( Volume: 110, Issue: 1, January 2001)",
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      "confidence": "medium",
      "note": "Composed from venue title, volume/issue and date",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "High-Definition Cabling and Return Loss",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
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      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "doi": "10.5594/J14160",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "href": "https://doi.org/10.5594/J14160",
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      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J14160",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "issn": {
      "print": "0036-1682",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
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    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_110_1/MIJR15Vol110No1.xml)",
      "source": "parsed",
      "updated": "2026-06-16T18:14:32.753Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "journalTitle": "SMPTE Journal",
    "journalTitle$meta": {
      "confidence": "high",
      "note": "Era-accurate journal title from SMPTE canonical repository (periodical parent at time of publication) (smpte-canonical-audit/canonicalLibrary.*.json)",
      "originalValue": null,
      "source": "parsed",
      "updated": "2026-07-08T00:35:38.133Z",
      "version": "smpte-canonical-repo@v1"
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    "number": "1",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "34–38",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publicationDate": "2001-01-01",
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      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
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      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_110_1/MIJR15Vol110No1.xml)",
        "source": "parsed",
        "updated": "2026-06-16T18:14:32.753Z",
        "version": "smpte-journal-issue-xml@v1"
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    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "references": {
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        "confidence": "medium",
        "note": "Extracted from NLM <ref-list> via extractSmpteJournalRefs.js (orphan-slug-mint)",
        "source": "parsed",
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      "confidence": "high",
      "note": "Backfilled from url.validate report #resolvedHref",
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      "source": "resolved",
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        "confidence": "medium",
        "note": "No explicit status in NLM source — journal papers default active",
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        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
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    "volume": "110",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J14160.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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