{
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  "docId": "10.5594-J13402",
  "document": {
    "abbrevTitle": "J SMPTE",
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      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "abstract": "The problems and pitfalls of exposure determination for reversal color films using ASA or DIN exposure index values are briefly discussed. A new system is described which permits the cameraman to establish by means of simple tests, which he can carry out by himself, the exposure latitude of a given film and the minimum and maximum photometric values which can be reproduced appropriately by the film. A light box and stepwedge in conjunction with a spot light meter are used for this purpose. Examples for practical production procedures are given. The test-exposure equipment is described in detail. The influence of making reversal duplicates from the camera original on the exposure necessary for the camera original is considered and the effects of “flashing” and “pushing” the original are illustrated. The use of color temperature correction filters within the K-rating system is described. The conclusion is reached that a reliable and simple exposure determination system can be established using purely photometric values and without recourse to standardized exposure indexes, such as ASA or DIN values.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "Werner Van Appeldorn"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1975",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J13402",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J13402",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "Journal of the SMPTE ( Volume: 84, Issue: 2, February 1975)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from venue title, volume/issue and date",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "The K-Rating System, a Reliable Exposure Determination System Using a Spot Exposure Meter",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J13402",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J13402",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J13402",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0361-4573",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_84_2/MIJR15Vol84No2.xml)",
      "source": "parsed",
      "updated": "2026-06-16T18:14:32.753Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "2",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "pages": "57–61",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publicationDate": "1975-02-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
        "source": "parsed",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_84_2/MIJR15Vol84No2.xml)",
        "source": "parsed",
        "updated": "2026-06-16T18:14:32.753Z",
        "version": "smpte-journal-issue-xml@v1"
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    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
      "source": "parsed",
      "updated": "2026-05-22T20:40:11.684Z",
      "version": "smpte-journal-article-nlm@v1"
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    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal papers default active",
        "source": "inferred",
        "updated": "2026-05-22T20:40:11.684Z",
        "version": "smpte-journal-article-nlm@v1"
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    "volume": "84",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13402.xml)",
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      "updated": "2026-05-22T20:40:11.684Z",
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