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"abstract": "Since the publication of the Kodak fine-grain developer formula for motion picture film1 many requests have been received for further details pertaining to its use, and for methods of altering its photographic characteristics. Experience has shown that the developer cannot be exhausted to the same degree as many developers which have been used previously because it is more sensitive to the retarding action of the products of development. Also a black sludge of metallic silver forms in the developer during its use, and with an exhausted developer an excess of sludge is present which tends to deposit on the negative.",
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"authors": [
"H. C. Carlton",
"J. I. Crabtree"
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"confidence": "high",
"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"updated": "2026-05-22T20:40:11.684Z",
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"holder": "Society of Motion Picture and Television Engineers, Inc.",
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"confidence": "high",
"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"version": "smpte-journal-article-nlm@v1"
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"year": "1929",
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"confidence": "high",
"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"version": "smpte-journal-article-nlm@v1"
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"docLabel": "Transactions of the Society of Motion Picture Engineers ( Volume: 13, Issue: 38, May 1929)",
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"docTitle": "Some Properties of Fine-Grain Developers for Motion Picture Film",
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"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"doi": "10.5594/J13109",
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"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"updated": "2026-05-22T20:40:11.684Z",
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"href": "https://doi.org/10.5594/J13109",
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"confidence": "high",
"note": "Constructed from DOI 10.5594/J13109",
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"updated": "2026-05-22T20:40:11.684Z",
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"issn": {
"print": "0096-6460",
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"confidence": "high",
"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"journalAcronym": "MIJR",
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"confidence": "high",
"note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_13_38/MIJR15Vol13No38.xml)",
"source": "parsed",
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"number": "38",
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"confidence": "high",
"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"pages": "406–444",
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"confidence": "high",
"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J13109.xml)",
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"country": "USA",
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"confidence": "high",
"note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_13_38/MIJR15Vol13No38.xml)",
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"volume": "13",
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