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    "abbrevTitle": "Transactions of the Society of Motion Picture Engineers",
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    "abstract": "The theory of illumination between two parallel planes was used by Nutting in the development of his reflectometer, but the deviations of the instrument from the simple theory were so large as to destroy its usefulness. It is an instrument of tho greatest simplicity and durability and is ideal where portability is desired. The present reflectometer, which is wedge shaped, is the result of a series of investigations looking to an instrument of good accuracy and at the same time maintaining the extreme simplicity and durability of the older instrument. The theory of illumination by a limited plane is touched on, and some of the details of specular reflection are examined. One form of a wedge reflectometer has been specially designed for direct vision, and has good accuracy for the particular angle of view fixed by the construction of the instrument. The second form of the instrument reads in a manner that is independent of the process of reflection and therefore gives accurate results for all types of diffuse or specular surfaces.",
    "abstract$meta": {
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    "authors": [
      "Frank Benford"
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      "holder": "Society of Motion Picture and Television Engineers, Inc.",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J10337.xml)",
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      "year": "1925",
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    "docTitle": "A New Reflectometer",
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    "doi": "10.5594/J10337",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J10337.xml)",
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        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J10337.xml)",
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    "journalAcronym": "MIJR",
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      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_9_21/MIJR15Vol9No21.xml)",
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    "number": "21",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J10337.xml)",
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    "pages": "101–112",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J10337.xml)",
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      "country": "USA",
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        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_9_21/MIJR15Vol9No21.xml)",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J10337.xml)",
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    "volume": "9",
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