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  "document": {
    "abstract": "Atomic absorption spectrophotometry is based on the ability of atoms to absorb radiation in narrow wavelength bands specific for each element. It is achieved by introducing a solution of the element into a controlled flame and passing radiant energy through this flame into a suitable detection and readout system. A practical application of atomic absorption is in the analysis for silver in fixing solutions. The current method involved electrodeposition of the metal, redissolving it in acid and final determination of the silver by a titrametric procedure. This analysis done with atomic absorption involves merely setting the instrument with standard solutions of known concentration, diluting the sample so that its concentration falls within these limits and comparing it on the instrument to the standards. This measurement allows the concentration of silver in the original solution to be easily calculated. Elapsed time for the analysis has been reduced from one-and-one half hours to approximately ten minutes.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
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      "updated": "2026-05-22T19:19:44.900Z",
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    "articleType": "research-article",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "R. F. Allaire",
      "F. P. Brackett",
      "J. T. Shafer"
    ],
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1967",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "docId": "10.5594-J09111",
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      "confidence": "high",
      "note": "Derived from DOI 10.5594/J09111",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "docLabel": "Journal of the SMPTE ( Volume: 76, Issue: 10, October 1967)",
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      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
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      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "docTitle": "Analytical Benefits of Atomic Absorption Spectrophotometric Methods",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
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      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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      "note": "NLM <article> — SMPTE journal paper",
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      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "doi": "10.5594/J09111",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
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      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "href": "https://doi.org/10.5594/J09111",
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      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J09111",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "issn": {
      "print": "0361-4573",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
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    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_76_10/MIJR15Vol76No10.xml)",
      "source": "parsed",
      "updated": "2026-06-16T16:11:59.617Z",
      "version": "smpte-journal-issue-xml@v1"
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    "number": "10",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "pages": "992–994",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
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      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publicationDate": "1967-10-01",
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      "confidence": "high",
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      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publisher": "SMPTE",
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      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
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      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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      "city": "White Plains, NY",
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        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
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      "country": "USA",
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        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_76_10/MIJR15Vol76No10.xml)",
        "source": "parsed",
        "updated": "2026-06-16T16:11:59.617Z",
        "version": "smpte-journal-issue-xml@v1"
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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        "confidence": "medium",
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    "volume": "76",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09111.xml)",
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