{ "$schema": "/api/schemas/documents.schema.json", "apiVersion": "1.0.0", "generatedAt": "2026-06-17T23:49:39.838Z", "sourcePath": "src/main/data/docs", "docId": "10.5594-J09040", "document": { "abstract": "In order to have interchangeable tape recordings, standards are needed for flux-frequency response and for the absolute value of the recorded flux. It is shown that the recorded signal is best measured and specified as the “shortcircuit flux per unit track width”; measurements techniques are reviewed. The need for equalization and the division into recording and reproducing equalization are developed. Standard equalizations of many organizations are shown as flux-frequency responses. Standard reference fluxes and operating levels are tabulated and discussed. The terms necessary for response and level standardization are proposed and defined and, since terms are not defined in presently published standards, those defined here are compared with usages of the standards.", "abstract$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "articleType": "research-article", "articleType$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "authors": [ "John G. Mcknight" ], "authors$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "copyright": { "holder": "Society of Motion Picture and Television Engineers, Inc.", "holder$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "year": "1969", "year$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" } }, "copyright$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "docId": "10.5594-J09040", "docId$meta": { "confidence": "high", "note": "Derived from DOI 10.5594/J09040", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "docLabel": "Journal of the SMPTE ( Volume: 78, Issue: 6, June 1969)", "docLabel$meta": { "confidence": "medium", "note": "Composed from journal title, volume, issue and date", "source": "inferred", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "docTitle": "Flux and Flux-Frequency Measurements and Standardization in Magnetic Recording", "docTitle$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "docType": "Journal Article", "docType$meta": { "confidence": "high", "note": "NLM
— SMPTE journal paper", "source": "inferred", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "doi": "10.5594/J09040", "doi$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "href": "https://doi.org/10.5594/J09040", "href$meta": { "confidence": "high", "note": "Constructed from DOI 10.5594/J09040", "source": "inferred", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "issn": { "print": "0361-4573", "print$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" } }, "issn$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "journalAcronym": "MIJR", "journalAcronym$meta": { "confidence": "high", "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_78_6/MIJR15Vol78No6.xml)", "source": "parsed", "updated": "2026-06-16T16:11:59.617Z", "version": "smpte-journal-issue-xml@v1" }, "number": "6", "number$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "pages": "457–472", "pages$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "publicationDate": "1969-06-01", "publicationDate$meta": { "confidence": "high", "note": "Day absent in NLM source — padded to 01", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "publisher": "SMPTE", "publisher$meta": { "confidence": "high", "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)", "source": "inferred", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "publisherLocation": { "city": "White Plains, NY", "city$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "country": "USA", "country$meta": { "confidence": "high", "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_78_6/MIJR15Vol78No6.xml)", "source": "parsed", "updated": "2026-06-16T16:11:59.617Z", "version": "smpte-journal-issue-xml@v1" } }, "publisherLocation$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" }, "status": { "active": true, "active$meta": { "confidence": "medium", "note": "No explicit status in NLM source — journal articles default active", "source": "inferred", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" } }, "volume": "78", "volume$meta": { "confidence": "high", "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J09040.xml)", "source": "parsed", "updated": "2026-05-22T19:19:44.900Z", "version": "smpte-journal-article-nlm@v1" } } }