{
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  "sourcePath": "src/main/data/docs",
  "docId": "10.5594-J07661",
  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "While the methods for measuring and controlling cross-modulation distortion have been practiced for many years, the costs of these tests preclude their use as frequently as one would desire for best quality control. This paper describes a new test instrument that permits the laboratory to exercise control for each individual printer and for each print. The instrument requires only an inch (2 ½ cm) of film rather than the several hundred feet (hundred or more meters) of film normally required for such a test. A special and unique feature of the instrument is the phase comparison test which indicates to the operator the direction and magnitude by which the print density should be changed for minimum distortion (i.e. the amount of increase or decrease in density required). In addition, the instrument provides a direct measure of the level of distortion that is present, and also an indication of printer performance (e.g. slippage contact, etc.). Since the test is obtained by simply inserting the test section into the instrument aperture, only a few seconds are required to make the analysis. All of the presently used cross-modulation tone-pairs are accepted by the instrument.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "Petro Vlahos"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1973",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J07661",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J07661",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "Journal of the SMPTE ( Volume: 82, Issue: 11, November 1973)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "A Phase Comparison Cross-Modulation Test Instrument",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J07661",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J07661",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J07661",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0361-4573",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_82_11/MIJR15Vol82No11.xml)",
      "source": "parsed",
      "updated": "2026-06-16T16:11:59.617Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "11",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "920–923",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1973-11-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_82_11/MIJR15Vol82No11.xml)",
        "source": "parsed",
        "updated": "2026-06-16T16:11:59.617Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal articles default active",
        "source": "inferred",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
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    },
    "volume": "82",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J07661.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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}