{
  "$schema": "/api/schemas/documents.schema.json",
  "apiVersion": "1.0.0",
  "generatedAt": "2026-06-17T23:49:39.838Z",
  "sourcePath": "src/main/data/docs",
  "docId": "10.5594-J06836",
  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "To control the discharge of water-contaminating substances, photoprocessing labs must first determine the nature of the contaminant and the extent of the discharge. This involves the taking of proper samples. Faulty sampling procedures result in unreliable analysis and erroneous conclusions which can not only be costly but also result in the plant's being denied access to the municipal sewer system. The sampling techniques and the means of flow measurement currently available to the photoprocessor are described, and the importance of effluent monitoring in establishing the effectiveness of recovery and reuse practices is emphasized. A basic approach to initiating an effective sampling program is presented. Tests for metals, acidity, chemical oxygen demand, 5-day biochemical oxygen demand, total organic carbon (expected to be widely used in the future) and many other factors are described. The use of sampling and flow measurement to improve the monitoring of silver levels and the effectiveness of silver recovery is discussed to illustrate the benefits and problems encountered with in-house effluent analysis. The paper features extensive references, bibliography, and tabulated information. Among the many items covered here are: manufacturers (scores of them, producing a great variety of equipment), principle of operation, cost, reliability, parameter measured, range of measurement, and ease of installation.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "Franklyn A. Ericson"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1976",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J06836",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J06836",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "SMPTE Journal ( Volume: 85, Issue: 4, April 1976)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Effluent Sampling and Flow Measurement for the Photoprocessor",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J06836",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J06836",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J06836",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0036-1682",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_85_4/MIJR15Vol85No4.xml)",
      "source": "parsed",
      "updated": "2026-06-16T16:11:59.617Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "4",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "197–205",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1976-04-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_85_4/MIJR15Vol85No4.xml)",
        "source": "parsed",
        "updated": "2026-06-16T16:11:59.617Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal articles default active",
        "source": "inferred",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "volume": "85",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06836.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    }
  }
}