{
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  "docId": "10.5594-J06177",
  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "The photographic properties of electrons accelerated by potentials below 50 kv have been investigated, with the general problem of data recording in mind. Recording systems using electrons directly for making the exposure offer advantages, particularly in speed, photographic resolution and absence of phosphor grain, over systems using conventional cathode-ray-tube photography. A strictly experimental system of this type has been developed for TV film recording.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "A. A. Tarnowski",
      "C. H. Evans"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1962",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
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    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J06177",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J06177",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "Journal of the SMPTE ( Volume: 71, Issue: 10, October 1962)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Photographic Data Recording by Direct Exposure with Electrons",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J06177",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J06177",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J06177",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0361-4573",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
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    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_71_10/MIJR15Vol71No10.xml)",
      "source": "parsed",
      "updated": "2026-06-16T16:11:59.617Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "10",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "765–768",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publicationDate": "1962-10-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
        "source": "parsed",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_71_10/MIJR15Vol71No10.xml)",
        "source": "parsed",
        "updated": "2026-06-16T16:11:59.617Z",
        "version": "smpte-journal-issue-xml@v1"
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    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal articles default active",
        "source": "inferred",
        "updated": "2026-05-22T19:19:44.900Z",
        "version": "smpte-journal-article-nlm@v1"
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    "volume": "71",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J06177.xml)",
      "source": "parsed",
      "updated": "2026-05-22T19:19:44.900Z",
      "version": "smpte-journal-article-nlm@v1"
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