{
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  "docId": "10.5594-J03747",
  "document": {
    "abbrevTitle": "SMPTE J",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "Just as the definition and measurement of jitter in baseband NTSC signals was a difficult topic for many years, it has now been found that jitter is of significant interest and of some controversy in the implementation of serial digital audio and video systems. Specifications such as 40 nsec of jitter in AES/EBU digital audio and 0.5 nsec of jitter in serial digital video are important to ensure conformance to the proposed standard. It is necessary to define jitter and appropriate measurement methods, as well as to understand how acceptable jitter in the signal interconnection system may affect resulting analog signals. Test methods can use wideband oscilloscopes or recently available television waveform monitors. Measurement of jitter in serial data systems is a developing subject for television applications. Several methods of measuring jitter, as well as test results for both digital audio and digital video, are discussed.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
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      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "David K. Fibush"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1993",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J03747",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J03747",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "SMPTE Journal ( Volume: 102, Issue: 8, August 1993)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Jitter Effects and Measurements in Serial Digital Television Signals",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J03747",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J03747",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J03747",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0036-1682",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_102_8/MIJR15Vol102No8.xml)",
      "source": "parsed",
      "updated": "2026-06-16T00:32:03.060Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "8",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "693–698",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1993-08-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_102_8/MIJR15Vol102No8.xml)",
        "source": "parsed",
        "updated": "2026-06-16T00:32:03.060Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal articles default active",
        "source": "inferred",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "volume": "102",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J03747.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
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