{
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  "docId": "10.5594-J02226",
  "document": {
    "abbrevTitle": "SMPTE J",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "New methods of test and measurement are required to determine the signs of health of the digital video transmission system. Analysis methods for the program video and audio signals are well known; however, measurements for the serial form of the digitized signal differ greatly from those used to analyze the familiar baseband video signal. Specifications such as 1-nsec risetime and 0.5 nsec of jitter are important to insure conformance to the proposed standard. Test methods can use wideband oscilloscopes or recently available television waveform monitors. Identification of errors in the serial data stream is a powerful and automatic method of determining system failures. Error rates in correctly operating equipment will be very low with, perhaps, hours or days between errors. Experimental results indicate that the difference between error-free operation and disaster can be just a few meters of coax if the system is being operated at the extremes of its capabilities. Suggestions are made for use of error detection in operational equipment.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "articleType": "research-article",
    "articleType$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      "David K. Fibush",
      "Bob Elkind"
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1992",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J02226",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J02226",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "SMPTE Journal ( Volume: 101, Issue: 9, September 1992)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Test and Measurement of Serial Digital Television Signals",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J02226",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J02226",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J02226",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0036-1682",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_101_9/MIJR15Vol101No9.xml)",
      "source": "parsed",
      "updated": "2026-06-16T00:32:03.060Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "number": "9",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "622–631",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1992-09-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08182015 BACKFILE JOURNAL FRESH/smptej_101_9/MIJR15Vol101No9.xml)",
        "source": "parsed",
        "updated": "2026-06-16T00:32:03.060Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal articles default active",
        "source": "inferred",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
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    },
    "volume": "101",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J02226.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
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