{
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  "docId": "10.5594-J00524",
  "document": {
    "abbrevTitle": "J SMPTE",
    "abbrevTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "abstract": "The RCA P200 test chart was developed to eliminate most of the variables involved in the process of measuring the resolution capabilities of a television camera tube. The test pattern produces measurements that are relatively independent of video-amplifier frequency response and eliminates signal variation or test-pattern brightness variations across the tube as a factor in the measurements. The pattern facilitates beam focus to assure minimum astigmatism and analysis of the astigmatism present in the system at the best focus. The use of narrow-band video-amplifier response in conjunction with this pattern greatly reduces noise and increases the accuracy of measurements. The P200 test chart also allows accurate measurement of the resolution of tubes with very high resolution characteristics.",
    "abstract$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "authors": [
      {
        "affiliation": "Image Device Application Engineering, RCA Electro-Optics and Devices, Solid State Division, Lancaster, PA 17604.",
        "name": "R.G. Neuhauser"
      }
    ],
    "authors$meta": {
      "confidence": "high",
      "note": "Object form (schema 2.3.0) migrated from string form via migrateAuthorsToObjectForm.js; bio/affiliation backfilled from _source/SMPTE/HIGHWIRE/ NLM <contrib-group>+<aff>+<bio>",
      "source": "parsed",
      "updated": "2026-06-23T00:04:25.562Z",
      "version": "authors-migrate-object-form@v1"
    },
    "contentType": "orig-research",
    "contentType$meta": {
      "confidence": "high",
      "note": "Cross-filled from SMPTE canonical repository import (smpte-canonical-audit/canonicalLibrary.*.json); previous value was a placeholder",
      "originalValue": "other",
      "source": "parsed",
      "updated": "2026-07-07T23:39:31.295Z",
      "version": "smpte-canonical-repo@v1"
    },
    "copyright": {
      "holder": "Society of Motion Picture and Television Engineers, Inc.",
      "holder$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "year": "1980",
      "year$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "copyright$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docId": "10.5594-J00524",
    "docId$meta": {
      "confidence": "high",
      "note": "Derived from DOI 10.5594/J00524",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docLabel": "SMPTE Journal ( Volume: 89, Issue: 2, February 1980)",
    "docLabel$meta": {
      "confidence": "medium",
      "note": "Composed from journal title, volume, issue and date",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docTitle": "Measuring Camera-Tube Resolution with the RCA P200 Test Chart",
    "docTitle$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "docType": "Journal Article",
    "docType$meta": {
      "confidence": "high",
      "note": "NLM <article> — SMPTE journal paper",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "doi": "10.5594/J00524",
    "doi$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "href": "https://doi.org/10.5594/J00524",
    "href$meta": {
      "confidence": "high",
      "note": "Constructed from DOI 10.5594/J00524",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "issn": {
      "print": "0036-1682",
      "print$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "issn$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "journalAcronym": "MIJR",
    "journalAcronym$meta": {
      "confidence": "high",
      "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_89_2/MIJR15Vol89No2.xml)",
      "source": "parsed",
      "updated": "2026-06-16T00:32:03.060Z",
      "version": "smpte-journal-issue-xml@v1"
    },
    "journalTitle": "SMPTE Journal",
    "journalTitle$meta": {
      "confidence": "high",
      "note": "Era-accurate journal title from SMPTE canonical repository (periodical parent at time of publication) (smpte-canonical-audit/canonicalLibrary.*.json)",
      "originalValue": null,
      "source": "parsed",
      "updated": "2026-07-08T00:35:38.133Z",
      "version": "smpte-canonical-repo@v1"
    },
    "number": "2",
    "number$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "pages": "97–100",
    "pages$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publicationDate": "1980-02-01",
    "publicationDate$meta": {
      "confidence": "high",
      "note": "Day absent in NLM source — padded to 01",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisher": "SMPTE",
    "publisher$meta": {
      "confidence": "high",
      "note": "Normalised to registry \"SMPTE\" convention from NLM publisher-name (The Society of Motion Picture and Television Engineers)",
      "source": "inferred",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "publisherLocation": {
      "city": "White Plains, NY",
      "city$meta": {
        "confidence": "high",
        "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
        "source": "parsed",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      },
      "country": "USA",
      "country$meta": {
        "confidence": "high",
        "note": "Parsed from journal_metadata XML (_source/SMPTE/APTARA/DL Project Files/08202015 BACKFILE JOURNAL FRESH/smptej_89_2/MIJR15Vol89No2.xml)",
        "source": "parsed",
        "updated": "2026-06-16T00:32:03.060Z",
        "version": "smpte-journal-issue-xml@v1"
      }
    },
    "publisherLocation$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
    },
    "references": {
      "bibliographic": [
        "10.5594-J15449",
        "10.5594-J14455"
      ],
      "bibliographic$meta": {
        "confidence": "medium",
        "note": "Extracted from NLM <ref-list> via extractSmpteJournalRefs.js (vol+pages)",
        "source": "parsed",
        "updated": "2026-07-06T17:47:19.108Z"
      }
    },
    "resolvedHref": "https://journal.smpte.org/periodicals/SMPTE%20Journal/89/2/6/",
    "resolvedHref$meta": {
      "confidence": "high",
      "note": "Backfilled from url.validate report #resolvedHref",
      "originalValue": null,
      "source": "resolved",
      "updated": "2026-06-19T20:59:07.401Z"
    },
    "status": {
      "active": true,
      "active$meta": {
        "confidence": "medium",
        "note": "No explicit status in NLM source — journal articles default active",
        "source": "inferred",
        "updated": "2026-05-22T18:56:53.245Z",
        "version": "smpte-journal-article-nlm@v1"
      }
    },
    "volume": "89",
    "volume$meta": {
      "confidence": "high",
      "note": "Parsed from NLM article XML (_source/SMPTE/HIGHWIRE/Source Bak/smptej/10.5594_J00524.xml)",
      "source": "parsed",
      "updated": "2026-05-22T18:56:53.245Z",
      "version": "smpte-journal-article-nlm@v1"
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}